The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2015

Filed:

Apr. 30, 2012
Applicants:

Jiangang Zhu, St. Louis, MO (US);

Sahin Kaya Ozdemir, St. Louis, MO (US);

Lan Yang, St. Louis, MO (US);

Inventors:

Jiangang Zhu, St. Louis, MO (US);

Sahin Kaya Ozdemir, St. Louis, MO (US);

Lan Yang, St. Louis, MO (US);

Assignee:

Washington University, St. Louis, MO (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 9/00 (2006.01); G01N 21/17 (2006.01); G01N 21/77 (2006.01); B82Y 35/00 (2011.01);
U.S. Cl.
CPC ...
G01N 21/7746 (2013.01); B82Y 35/00 (2013.01); Y10S 977/88 (2013.01);
Abstract

A particle detection system is provided. The particle detection system includes at least one tapered optical fiber, a light source configured to transmit light through the at least one tapered optical fiber, a photodetector configured to measure a characteristic of the light being transmitted through the at least one optical fiber, and a computing device coupled to the photodetector and configured to determine whether a nanoparticle is present within an evanescent field of the at least one tapered optical fiber based on the measured light characteristic.


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