The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2015
Filed:
Feb. 19, 2008
Mitsuharu Hirai, Kyoto, JP;
Satoshi Majima, Kyoto, JP;
Taira Maekawa, Kyoto, JP;
Shinya Kimura, Kyoto, JP;
Mitsuharu Hirai, Kyoto, JP;
Satoshi Majima, Kyoto, JP;
Taira Maekawa, Kyoto, JP;
Shinya Kimura, Kyoto, JP;
Arkray, Inc., Kyoto, JP;
Abstract
Detection probes are provided that are capable of detecting a sequence to be detected containing a mutation even when a sequence not to be detected containing no mutation coexists with the sequence to be detected containing a mutation, which are different only in a single base from each other. At least one oligonucleotide selected from the group consisting of SEQ ID NOs: 2˜16 is used as a probe. Even in a sample containing an abl gene in which a mutation has occurred and an abl gene in which no mutation has occurred, the use of such probes in, for example, Tm analysis allows the mutation to be detected.