The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2015
Filed:
Apr. 27, 2011
Applicants:
Feng Han, Johnston, IA (US);
Maria Katt, Lenexa, KS (US);
Wolfgang Schuh, West Des Moines, IA (US);
David M. Webb, Zionsville, IN (US);
Inventors:
Feng Han, Johnston, IA (US);
Maria Katt, Lenexa, KS (US);
Wolfgang Schuh, West Des Moines, IA (US);
David M. Webb, Zionsville, IN (US);
Assignee:
Pioneer Hi-Bred International, Inc., Johnston, IA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C07H 21/02 (2006.01); C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6895 (2013.01);
Abstract
Markers associated withstem rot resistance are provided. Methods of identifying resistant, and susceptible plants, using the markers are provided. Methods for identifying and isolating QTL are a feature of the invention, as are QTL associated withstem rot resistance.