The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2015

Filed:

Nov. 21, 2012
Applicant:

California Institute of Technology, Pasadena, CA (US);

Inventors:

Xiquan Cui, Pasadena, CA (US);

Scott E. Fraser, Glendale, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/12 (2013.01); A61B 3/10 (2013.01);
Abstract

A method for noninvasive analysis of a retina includes exposing the retina to one or more first sets of at least three illumination light signals. The at least three illumination light signals each have a different wavelength. The method also includes optically collecting a reflected light signal for each of the at least three illumination light signals of the one or more first sets. Each of the reflected light signals is a portion of the respective illumination light signal reflected by the retina. The method further includes detecting the reflected light signals of the one or more first sets as a function of intensity. The method still further includes determining a first opsin density using the detected intensity of each of the reflected light signals of the one or more first sets.


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