The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2015

Filed:

May. 31, 2012
Applicants:

Cynthia C. Contreras, Kettering, OH (US);

Edward A. Cuellar, Canandaigua, NY (US);

Shawn R. Markham, Harrodsburg, KY (US);

Inventors:

Cynthia C. Contreras, Kettering, OH (US);

Edward A. Cuellar, Canandaigua, NY (US);

Shawn R. Markham, Harrodsburg, KY (US);

Assignee:

Corning Incorporated, Corning, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/38 (2006.01); G01N 21/23 (2006.01); G01N 21/896 (2006.01);
U.S. Cl.
CPC ...
G01N 33/386 (2013.01); G01N 21/23 (2013.01); G01N 21/896 (2013.01);
Abstract

A method of reducing distortion in a glass sheet is described and comprises the steps of: forming a glass ribbon in a glass manufacturing process; separating a glass sheet from the glass ribbon, the glass sheet having a substantially flat surface; measuring a retardation through the surface of the glass sheet; defining a retardation parameter indicative of the retardation of the glass sheet; cutting the glass sheet into a plurality of sub-sheets; measuring a distortion of the sub-sheets; defining a distortion parameter indicative of the distortion of the sub-sheets; and determining a correlation between the retardation parameter and the distortion parameter such that the distortion parameter of sub-sheets of a subsequent glass sheet can be predicted based on the correlation.


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