The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2015
Filed:
Apr. 30, 2013
Applicant:
Quality Vision International, Inc., Rochester, NY (US);
Inventors:
William E. Stevens, Byron, NY (US);
Jason Patti, Rochester, NY (US);
David E. Lawson, Webster, NY (US);
Assignee:
Quality Vision International, Inc., Rochester, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/012 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
G01B 21/047 (2013.01); G01B 5/012 (2013.01);
Abstract
A probe deployment mechanism of a coordinate measuring machine provides for extending and retracting a probe. The probe is displaceable with respect to the actuator body connected to the measuring machine. A locator coupling secures the probe to the actuator body at the extended position for taking measurements. A drive coupled to the probe displaces the probe between the extended and retracted positions but at the extended position, the drive is releasable from the probe for kinetically isolating the locator coupling.