The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

Jul. 12, 2013
Applicant:

Google Inc., Mountain View, CA (US);

Inventors:

Dehao Chen, Mountain View, CA (US);

Xinliang David Li, Mountain View, CA (US);

Assignee:

Google Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
G06F 8/4443 (2013.01);
Abstract

A system and method for using inline stacks to improve the performance of application binaries is included. While executing a first application binary, profile data may be collected about the application that includes which callee functions are called from the application's callsites and the number of times each inline stack is executed. A context summary map may be created from the collected profile data which shows a summary of the total execution count of all instructions in the callee function for each callsite inlined in the application's normal binary. Using the context summary map, each function callsite's execution count may be compared with a predetermined threshold to determine if the function should be inlined. Then the application's profile may be annotated and a second application binary, an optimized binary, may be generated using the annotated profile.


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