The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2015
Filed:
Dec. 18, 2006
Jeffrey R. Cobb, Belmont, CA (US);
Daryl L. Puryear, San Mateo, CA (US);
Ling Thio, Sunnyvale, CA (US);
Jeffrey R. Cobb, Belmont, CA (US);
Daryl L. Puryear, San Mateo, CA (US);
Ling Thio, Sunnyvale, CA (US);
CA, Inc., New York, NY (US);
Abstract
Instrumentation points are selected for an application by running the application with comprehensive instrumentation of its components in a development mode. The application can be run by a human operator and/or load simulator which provides requests to the application. The instrumented components are monitored as the application runs. A subset of the components is selected based on criteria such as an order in which the instrumented components are invoked, whether resource utilization, such as consumption of processor cycles, exceeds a threshold, or a frequency with which components are called or call other components, and only that subset is instrumented in a production mode of the application. In one approach, the subset includes components which are invoked when traffic to/from the application matches a pattern provided by an interaction model. As a result, relevant instrumentation points can be identified.