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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9009677 B1

PDFFull Text
Date of Patent:
Apr. 14, 2015

Filed:

Mar. 18, 2013

Application testing and analysis

Applicant:

Microsoft Corporation, Redmond, WA (US);

Inventors:

Feng Zhao, Bellevue, WA (US);

Niels Brouwers, Delft, NL;

Nicholas Donald Atkins Lane, Beijing, CN;

Chieh-Jan Mike Liang, Beijing, CN;

Ranveer Chandra, Bellevue, WA (US);

Assignee:

Microsoft Technology Licensing, LLC, Redmond, WA (US);

Attorneys:

Dan Choi

Judy Yee

Micky Minhas

Primary Examiner:

Philip Wang

Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3414 (2013.01); G06F 11/3466 (2013.01); G06F 11/3409 (2013.01); G06F 2201/865 (2013.01);
Abstract

Application testing and analysis may include performing perturbations to affect an environment associated with the application executing on a user device without affecting other applications executing on the user device. The execution of the application may be traced while the perturbations are being performed to determine an amount of resources of the user device consumed by the application and to determine whether a performance of the application was degraded.

Find Patent Forward Citations

Zhao, Feng. (2015). Application testing and analysis (U.S. Patent No. 9009677). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9009677

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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