The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

Jun. 10, 2009
Applicants:

Henry Lo, Surrey, CA;

Ian Forneri, Ridgeville, CA;

Julian Gosper, Vancouver, CA;

Oliver Woolgar, Burnaby, CA;

Paul Mcarthur, Vancouver, CA;

Qing LI, Vancouver, CA;

Soroush Momen-pour, Coquitlam, CA;

Stephen Petschulat, Coquitlam, CA;

Inventors:

Henry Lo, Surrey, CA;

Ian Forneri, Ridgeville, CA;

Julian Gosper, Vancouver, CA;

Oliver Woolgar, Burnaby, CA;

Paul McArthur, Vancouver, CA;

Qing Li, Vancouver, CA;

Soroush Momen-Pour, Coquitlam, CA;

Stephen Petschulat, Coquitlam, CA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30554 (2013.01); G06F 17/30572 (2013.01); G06F 17/30592 (2013.01);
Abstract

Described herein are methods and systems for analyzing multidimensional data that use tangential exploration of data via a third or Z-dimension to the current two-dimensional view. The tangential exploration allows higher dimensionality to be explored without causing visual clutter.


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