The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2015
Filed:
Mar. 15, 2013
Seungjune Jeon, Milpitas, CA (US);
Ying Tai, Mountain View, CA (US);
Jiangli Zhu, Sunnyvale, CA (US);
Xiaoheng Chen, San Jose, CA (US);
Seungjune Jeon, Milpitas, CA (US);
Ying Tai, Mountain View, CA (US);
Jiangli Zhu, Sunnyvale, CA (US);
Xiaoheng Chen, San Jose, CA (US);
SanDisk Enterprise IP LLC, Milpitas, CA (US);
Abstract
Systems, methods and/or devices that enhance the reliability with which data can be stored in and read from a memory utilize an error indicator to adaptively determine the soft information values used for decoding. For example, in some implementations, the method includes selecting a first set of one or more soft information values and receiving a read data command. The method further includes responding to the read data command by initiating performance of a data access operation to access data in a storage medium, the data access operation producing a syndrome weight; determining a first indicator based at least in part on the syndrome weight; based on the first indicator, selecting a second set of one or more soft information values; and decoding data obtained from the data access operation using the second set of one or more soft information values to produce a result.