The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2015
Filed:
Jun. 14, 2010
Applicants:
Yee-hsiang Sean Chang, Cupertino, CA (US);
Yiqiang Ding, San Jose, CA (US);
John S. Hoch, Palo Alto, CA (US);
Inventors:
Yee-Hsiang Sean Chang, Cupertino, CA (US);
Yiqiang Ding, San Jose, CA (US);
John S. Hoch, Palo Alto, CA (US);
Assignee:
Rasilient Systems, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 5/00 (2006.01); G06F 12/00 (2006.01); G06F 13/00 (2006.01); G06F 11/00 (2006.01); H04L 29/08 (2006.01); H04L 29/14 (2006.01);
U.S. Cl.
CPC ...
H04L 67/36 (2013.01); H04L 69/40 (2013.01); H04L 67/1097 (2013.01);
Abstract
A method for indicating an overload condition of a data storage system, comprises the steps of: defining one or more load indexes, wherein each of the load indexes has an overload threshold; and if one of the load indexes has met its respective overload threshold, providing an indicator of the overload condition of the storage system, else, monitoring the load indexes.