The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

Aug. 19, 2011
Applicants:

Jingrui He, Ossining, NY (US);

Ravi B. Konuru, Tarrytown, NY (US);

Ching-yung Lin, Forest Hills, NY (US);

Hanghang Tong, Ossining, NY (US);

Zhen Wen, Springfield, NJ (US);

Inventors:

Jingrui He, Ossining, NY (US);

Ravi B. Konuru, Tarrytown, NY (US);

Ching-Yung Lin, Forest Hills, NY (US);

Hanghang Tong, Ossining, NY (US);

Zhen Wen, Springfield, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/3053 (2013.01); G06F 17/30958 (2013.01); G06F 17/30592 (2013.01); G06F 2216/03 (2013.01);
Abstract

A method, system and computer program product for finding a diversified ranking list for a given query. In one embodiment, a multitude of date items responsive to the query are identified, a marginal score is established for each data item; and a set, or ranking list, of the data items is formed based on these scores. This ranking list is formed by forming an initial set, and one or more data items are added to the ranking list based on the marginal scores of the data items. In one embodiment, each of the data items has a measured relevance and a measured diversity value, and the marginal scores for the data items are based on the measured relevance and the measured diversity values of the data items.


Find Patent Forward Citations

Loading…