The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2015
Filed:
Jan. 08, 2010
Antoni Fertner, Stockholm, SE;
Fredrik Lindqvist, Järfälla, SE;
Ioanna Pappa, Stockholm, SE;
Klas Ericson, Älvsjö, SE;
Miguel Berg, Upplands Väsby, SE;
Per Ola Börjesson, Lund, SE;
Stefan Höst, Svedala, SE;
Antoni Fertner, Stockholm, SE;
Fredrik Lindqvist, Järfälla, SE;
Ioanna Pappa, Stockholm, SE;
Klas Ericson, Älvsjö, SE;
Miguel Berg, Upplands Väsby, SE;
Per Ola Börjesson, Lund, SE;
Stefan Höst, Svedala, SE;
Telefonaktiebolaget LM Ericsson (Publ), Stockholm, SE;
Abstract
Embodiments of the present invention relate to an arrangement for analyzing transmission line properties. Measurement data providing means provide data of a first frequency dependent line property, line property calculation arrangement with model handling means, a Hubert transform handler and line property determination means calculate said first property based on model parameters, line resistance at 0 frequency, r, a cut-off frequency, v, a line capacitance Cand a line inductance L. The line model handling means calculates the line inductance L(f) via a Hubert transform of a function of Q(f/v), wherein the function Q(f/v) relates the line resistance R(f) to ras R(f)=r·Q(f/v). The Hilbert transform values are calculated using a parameterized closed form expression for the Hubert transform or they are tabulated. The line property determination means calculates the first property and criteria function application means uses the measured first property and the calculated first property for model parameters to find optimized numerical model parameter values.