The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

May. 26, 2011
Applicants:

Jiri Vass, Prague, CZ;

Ard Van Schie, Honselersdijk, NL;

Inventors:

Jiri Vass, Prague, CZ;

Ard Van Schie, Honselersdijk, NL;

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G05B 23/02 (2006.01); G05B 9/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0221 (2013.01); G05B 9/02 (2013.01);
Abstract

Processing systems and methods used to identify faults in the operation of one or more field instruments are described and shown. In one embodiment, a sensing system includes one or more field instruments and a processing component configured to process data from the field instruments. This processing may include identifying invalid samples of data using an algorithm; correlating invalid samples of data to specific field instruments; and determining a likelihood of a fault occurring on the specific field instruments. The processing may occur in real-time using an online processing technique, or with an offline processing technique on data maintained in a data store.


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