The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

Aug. 16, 2012
Applicant:

Chien-ming Chen, Zhubei, TW;

Inventor:

Chien-Ming Chen, Zhubei, TW;

Assignee:

MStar Semiconductor, Inc., Hsinchu Hsien, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06T 5/50 (2013.01); G06T 7/0075 (2013.01); G06T 2207/10012 (2013.01);
Abstract

A processing method for a pair of stereo images is provided. The method includes: extracting a pair of edge images from the stereo images, each edge image having edge pixels, each edge pixel of one of the edge images being associated with an overlap record and a disparity record; providing a plurality of image lateral shifts to sequentially determine a plurality of overlap levels between the pair of edge images; and updating the overlap record and the disparity record associated with a selected edge pixel to a maximum overlap level and a most-likely disparity, respectively. The maximum overlap level is a maximum among a plurality of associated overlap levels to which the selected edge pixel contributes. The most-likely disparity corresponds to the maximum overlap level.


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