The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

Jan. 28, 2013
Applicant:

Wisconsin Alumni Research Foundation, Madison, WI (US);

Inventors:

Sean B. Fain, Madison, WI (US);

Kevin M. Johnson, Madison, WI (US);

Jeremy W. Gordon, Madison, WI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G01R 33/48 (2006.01); A61B 5/055 (2006.01); G01R 33/56 (2006.01); G01R 33/485 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G06T 11/003 (2013.01); G01R 33/4824 (2013.01); G01R 33/5601 (2013.01); G01R 33/485 (2013.01); G01R 33/561 (2013.01);
Abstract

A system and method for simultaneously generating spectral images and spatial images of a subject using a magnetic resonance imaging (MRI) system includes acquiring MR image data using a k-space sampling trajectory. The k-space sampling trajectory is designed to spatially oversample to elicit phase differences between oversampled points. The MR image data is jointly reconstructed into spatial and spectral images by resolving spatial information from spatial encoding associated with each of the oversampled points and resolving spectral information from the phase differences between the oversampled points.


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