The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2015
Filed:
Jul. 29, 2011
Dong-goo Kang, Suwon-si, KR;
Seok-min Han, Seongnam-si, KR;
Seong-deok Lee, Seongnam-si, KR;
Young-hun Sung, Hwaseong-si, KR;
Sung-su Kim, Yongin-si, KR;
Hyun-hwa OH, Hwaseong-si, KR;
Jae-hyun Kwon, Hwaseong-si, KR;
Dong-goo Kang, Suwon-si, KR;
Seok-min Han, Seongnam-si, KR;
Seong-deok Lee, Seongnam-si, KR;
Young-hun Sung, Hwaseong-si, KR;
Sung-su Kim, Yongin-si, KR;
Hyun-hwa Oh, Hwaseong-si, KR;
Jae-hyun Kwon, Hwaseong-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method of processing an image is provided. The method includes estimating a thickness of an object that includes at least two materials, from a radiation image taken with radiations of at least two energy bands; and generating an image by comparing the estimated thickness to a thickness of a local region and extracting a region of interest.