The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

Nov. 30, 2011
Applicants:

Benoit Drooghaag, Ophain-Bois-Seigneur-Isaac, BE;

Nicolas Dupuis, Chaudfontaine, BE;

Inventors:

Benoit Drooghaag, Ophain-Bois-Seigneur-Isaac, BE;

Nicolas Dupuis, Chaudfontaine, BE;

Assignee:

Alcatel Lucent, Boulogne-Billancourt, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04M 3/22 (2006.01); H04M 3/30 (2006.01); H04M 11/06 (2006.01);
U.S. Cl.
CPC ...
H04M 3/2209 (2013.01); H04M 3/306 (2013.01); H04M 11/062 (2013.01);
Abstract

Method for testing an analog front end coupled to a telecommunication line of a telecommunication system and a related testing system is described. The testing system comprises a single ended line testing measurement module for applying single ended line testing measurements via said analog front-end upon said line and for collecting thereby single ended line testing measurements; and a processing means for interpreting the single ended line testing measurements and for thereby judging that the analog front end being out of order and a control means for controlling the single ended line testing measurement module and processing means.


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