The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2015
Filed:
Jul. 18, 2012
Deming Shu, Darian, IL (US);
Yuri Shvydko, Lisle, IL (US);
Stanislav A. Stoupin, Willowbrook, IL (US);
Ruben Khachatryan, Plano, IL (US);
Kurt A. Goetze, Geneva, IL (US);
Timothy Roberts, Hobart, IN (US);
Deming Shu, Darian, IL (US);
Yuri Shvydko, Lisle, IL (US);
Stanislav A. Stoupin, Willowbrook, IL (US);
Ruben Khachatryan, Plano, IL (US);
Kurt A. Goetze, Geneva, IL (US);
Timothy Roberts, Hobart, IN (US);
UChicago Argonne, LLC, Chicago, IL (US);
Abstract
A method and an ultrahigh-resolution spectrometer including a precision mechanical structure for positioning inelastic X-ray scattering optics are provided. The spectrometer includes an X-ray monochromator and an X-ray analyzer, each including X-ray optics of a collimating (C) crystal, a pair of dispersing (D) element crystals, anomalous transmission filter (F) and a wavelength (W) selector crystal. A respective precision mechanical structure is provided with the X-ray monochromator and the X-ray analyzer. The precision mechanical structure includes a base plate, such as an aluminum base plate; positioning stages for D-crystal alignment; positioning stages with an incline sensor for C/F/W-crystal alignment, and the positioning stages including flexure-based high-stiffness structure.