The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

Aug. 30, 2012
Applicants:

Jian Wang, Beijing, CN;

Bin YE, Beijing, CN;

Yannan Huang, Beijing, CN;

Yonghui Han, Beijing, CN;

Inventors:

Jian Wang, Beijing, CN;

Bin Ye, Beijing, CN;

Yannan Huang, Beijing, CN;

Yonghui Han, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/08 (2006.01); A61B 6/00 (2006.01); A61B 6/06 (2006.01);
U.S. Cl.
CPC ...
A61B 6/52 (2013.01); A61B 6/06 (2013.01); A61B 6/08 (2013.01); A61B 6/469 (2013.01); A61B 6/4021 (2013.01); A61B 6/548 (2013.01);
Abstract

A method for adjusting a field of view for exposure of an X-ray system is provided. The method comprises: capturing an image of a patient on an examining table of the system by an image sensor, wherein the image sensor is placed at a predetermined position in the system; displaying the captured image on a display for selection of a region of interest or a point of interest by a user on the image; automatically determining a target position of an X-ray source in response to the selection of the region of interest or the point of interest on the image, wherein a desired field of view for exposure covering the region of interest or the point of interest is obtained when the X-ray source is located at the target position; and automatically locating the X-ray source at the target position in response to the determination of the target position.


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