The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2015
Filed:
Jun. 20, 2011
Masahiko Okunuki, Akiruno, JP;
Makoto Sato, Tokyo, JP;
Osamu Tsujii, Kawasaki, JP;
Takashi Ogura, Tokyo, JP;
Hisashi Namba, Utsunomiya, JP;
Masahiko Okunuki, Akiruno, JP;
Makoto Sato, Tokyo, JP;
Osamu Tsujii, Kawasaki, JP;
Takashi Ogura, Tokyo, JP;
Hisashi Namba, Utsunomiya, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An X-ray imaging apparatus includes a multi X-ray source which includes a plurality of X-ray focuses to generate X-rays by irradiating X-ray targets with electron beams, a detector which detects X-rays which have been emitted from the multi X-ray source and have reached a detection surface, and a moving mechanism for moving the multi X-ray source within a plane facing the detection surface. The X-ray imaging apparatus acquires a plurality of X-ray detection signals from the detector by causing the multi X-ray source to perform X-ray irradiation while shifting the positions of a plurality of X-ray focuses which the detector has relative to the detection surface by moving the multi X-ray source using the moving mechanism. The apparatus then generates an X-ray projection image based on the plurality of X-ray detection signals acquired by the detector.