The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

May. 22, 2013
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Zhi Yan, Beijing, CN;

Gang Sun, Beijing, CN;

Xin Wang, Beijing, CN;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/00 (2009.01); H04W 24/00 (2009.01); H04J 11/00 (2006.01); H04W 48/16 (2009.01);
U.S. Cl.
CPC ...
H04W 24/00 (2013.01); H04J 11/0069 (2013.01); H04W 48/16 (2013.01);
Abstract

A method and apparatus for searching carrier frequencies (CFs) including determining all CFs to be measured within a frequency band according to a predetermined frequency interval; selecting part of the CFs as Sampling Measurement CFs (SMCFs) according to a predetermined band search step, and for each of the SMCFs, calculating initial peak to average ratio (PAR) of the SMCFs; weighting the initial PAR of each of the SMCFs by using initial PARs of SMCFs left and right neighboring each of the SMCFs, to obtain a determined PAR of each of the SMCFs; ordering the determined PARs of all the SMCFs, and selecting, in a descending order of the determined PARs, a predetermined number of SMCFs and frequencies to be measured left and right neighboring the selected SMCFs as a search result.


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