The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

Jul. 18, 2012
Applicant:

Fumiaki Otera, Kyoto, JP;

Inventor:

Fumiaki Otera, Kyoto, JP;

Assignee:

Shimadzu Corporation, Kyoto-Shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/61 (2006.01); G01J 3/42 (2006.01); G01N 21/39 (2006.01); G01N 21/3504 (2014.01); G01N 21/85 (2006.01);
U.S. Cl.
CPC ...
G01J 3/42 (2013.01); G01N 21/61 (2013.01); G01N 21/39 (2013.01); G01N 21/3504 (2013.01); G01N 21/85 (2013.01);
Abstract

A gas analyzer is capable of detecting abnormality of a measurement environment without using either or both of a pressure sensor and a gas temperature sensor. The gas analyzer creates absorption spectra from transmitted light intensity of laser beams applied to gas for measuring the amount of spread W and compares the amount of spread against a threshold D. The amount of spread of the absorption spectra does not depend on pressure if the pressure of the gas to be measured falls within a high-vacuum region, and monotonously increases with increased pressure if the pressure of the gas to be measured is higher than the high-vacuum region. Thus, if W>D, it is determined that the measurement environment does not form a high-vacuum region and abnormality is transmitted to the outside. In all other cases, the measurement environment is deemed to form a high-vacuum region, and partial pressure is calculated.


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