The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2015
Filed:
Feb. 16, 2012
Kazuhiro Takigawa, Nagaokakyo, JP;
Takashi Kondo, Nagaokakyo, JP;
Seiji Kamba, Nagaokakyo, JP;
Yuichi Ogawa, Sendai, JP;
Kazuhiro Takigawa, Nagaokakyo, JP;
Takashi Kondo, Nagaokakyo, JP;
Seiji Kamba, Nagaokakyo, JP;
Yuichi Ogawa, Sendai, JP;
Murata Manufacturing Co., Ltd., Nagaokakyo-Shi, Kyoto-Fu, JP;
National University Corporation Tohoku University, Sendai-Shi, Miyagi, JP;
Abstract
A measurement method that includes irradiating a void-arranged structure on which an analyte has been held with an electromagnetic wave, detecting an electromagnetic wave scattered on the void-arranged structure, and determining a property of the analyte on the basis of at least one parameter, the parameter including the amount of change in the ratio of the detected electromagnetic wave to the irradiated electromagnetic wave at a specific frequency between the presence and the absence of the analyte.