The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

Aug. 10, 2012
Applicants:

Eddie Azuma, San Jose, CA (US);

Chih Yen Liu, San Jose, CA (US);

Josh Tsai, San Jose, CA (US);

Emerson Yu, San Jose, CA (US);

David Hsieh, San Jose, CA (US);

Inventors:

Eddie Azuma, San Jose, CA (US);

Chih Yen Liu, San Jose, CA (US);

Josh Tsai, San Jose, CA (US);

Emerson Yu, San Jose, CA (US);

David Hsieh, San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); H04N 5/232 (2006.01); H04N 5/228 (2006.01); G03B 3/10 (2006.01); G02B 7/09 (2006.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
G03B 3/10 (2013.01); G02B 7/09 (2013.01); H04N 5/2252 (2013.01); H04N 5/2254 (2013.01); H01L 27/14618 (2013.01); H04N 5/2257 (2013.01);
Abstract

A compact camera module has an EMI housing configured to shield camera module components from electromagnetic interference and having defined therein a focus-adjustment aperture to permit an optical train to extend to at one end of an auto-focus range, and a light leak baffle partially overlaps the focus-adjustment aperture along the optical path outside the auto-focus range.


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