The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

Aug. 09, 2012
Applicants:

Douglas M. Chin, Windham, MA (US);

Daniel B. Grunberg, Lexington, MA (US);

John K. Iler, Burlington, MA (US);

Ronald Laidley, Somerville, MA (US);

Inventors:

Douglas M. Chin, Windham, MA (US);

Daniel B. Grunberg, Lexington, MA (US);

John K. Iler, Burlington, MA (US);

Ronald Laidley, Somerville, MA (US);

Assignee:

Immedia Semiconductor, Inc., Andover, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/64 (2006.01); H04N 19/186 (2014.01);
U.S. Cl.
CPC ...
H04N 19/186 (2013.01);
Abstract

One example configuration as discussed herein includes a multi-stage image processing system. A first stage image processor in the multi-stage image processing system analyzes a first window of settings produced by an array of sensor elements in an image sensor. The first stage image processor scales one or more color ranges to detect defective sensor elements and produces corrective values on an as-needed basis. A second stage image-processing resource processes a second window of settings including original settings and/or substitute settings as produced by the first stage image processor. The second stage image processor applies a debayering algorithm to the second window of values to produce final display settings for the sensor elements.


Find Patent Forward Citations

Loading…