The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2015
Filed:
Mar. 14, 2013
Amazon Technologies, Inc., Reno, NV (US);
Chang Yuan, Seattle, WA (US);
Richard Howard Suplee, III, Bainbridge Island, WA (US);
Daniel Bibireata, Seattle, WA (US);
Honghong Peng, San Jose, CA (US);
Leo Benedict Baldwin, San Jose, CA (US);
Geoffrey Scott Heller, Seattle, WA (US);
Wei Li, Cupertino, CA (US);
Amazon Technologies, Inc., Reno, NV (US);
Abstract
Systems and approaches are provided for obtaining high quality image data from lower resolution and/or lower quality image data. An electronic device can be calibrated comprehensively prior to being provided to a user. The calibrated electronic device can be used to capture image data, image metadata, and other sensor data substantially simultaneously. Super-resolution processing can be applied to the captured image data to obtain higher quality image data than the captured image data, such as image data that corresponds to a higher resolution, has less blur, has less noise, has fewer photometric imperfections, and/or has fewer artifacts.