The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

Oct. 31, 2012
Applicant:

The Aerospace Corporation, El Segundo, CA (US);

Inventors:

Stephen La Lumondiere, Torrance, CA (US);

Terence Yeoh, Pasadena, CA (US);

David Cardoza, Los Alamitos, CA (US);

Assignee:

The Aerospace Corporation, El Segundo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 5/222 (2006.01); G01N 21/95 (2006.01); H04N 5/235 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2354 (2013.01); G01N 21/9505 (2013.01);
Abstract

Various embodiments are directed to imaging systems and methods for generating an image of a sub-surface feature of an object through a surface of the object. An illumination array may comprise a plurality of illumination sources positioned around the sub-surface feature of the object. An imaging device may comprise an objective. A computer system may be in communication with the illumination array. The computer system may be programmed to calculate an optimized illumination pattern of the plurality of illumination sources for imaging the sub-surface feature; activate the optimized illumination pattern; and instruct the imaging device to capture an image of the sub-surface feature with the imaging device based on reflected illumination from the optimized illumination pattern.


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