The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2015
Filed:
Jul. 26, 2012
Woobum Kang, Osaka, JP;
Woobum Kang, Osaka, JP;
Keyence Corporation, Osaka, JP;
Abstract
Provided are a magnification observation device, a magnification observation method, and a magnification observation program in which connected image data can be efficiently obtained in a short period of time when re-imaging an object to obtain the connected image data corresponding to a plurality of unit regions. A plurality of unit regions on a surface of an observation object are imaged, and a plurality of pieces of image data respectively corresponding to the plurality of unit regions are generated. An image of the object including the plurality of unit regions is displayed as a region presentation image. When any of the plurality of unit regions is selected by a selection instruction from a user, the selected unit region is re-imaged, to generate image data corresponding to the selected unit region as re-imaged data.