The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9007259 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 14, 2015

Filed:

Jun. 13, 2014
Applicants:

Advanced Testing Technologies, Inc., Hauppauge, NY (US);

Eli Levi, Dix Hills, NY (US);

Inventors:

Shahen Minassian, Dix Hills, NY (US);

Richard Engel, Ridge, NY (US);

Eli Levi, Dix Hills, NY (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/40 (2006.01);
U.S. Cl.
CPC ...
G01S 7/40 (2013.01); G01S 7/4052 (2013.01);
Abstract

Phase noise analyzing system that analyzes phase noise in radio frequency (RF) signals provided by a device under test when coupled thereto includes a low noise receiver that receives at a first input, signal from the device under test when coupled thereto, a low noise synthesizer that provides output to the receiver, a frequency domain analyzer that receives output from the receiver, a time domain analyzer that receives output from the receiver, a switching system that controls signal flow to and from the receiver, the synthesizer, the frequency domain analyzer and the time domain analyzer, and a computer that controls the switching system to perform the analysis of phase noise in signals provided by the device under test.


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