The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

Jun. 07, 2012
Applicants:

Shinnosuke Maeda, Nagoya, JP;

Hajime Saiki, Nagoya, JP;

Satoshi Hirano, Nagoya, JP;

Inventors:

Shinnosuke Maeda, Nagoya, JP;

Hajime Saiki, Nagoya, JP;

Satoshi Hirano, Nagoya, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H05K 1/03 (2006.01); H05K 3/02 (2006.01); H05K 3/10 (2006.01); H05K 3/40 (2006.01); H05K 1/02 (2006.01); H01L 23/498 (2006.01); H01L 21/48 (2006.01); H01L 23/544 (2006.01); H01L 21/683 (2006.01); H05K 1/11 (2006.01); H05K 3/46 (2006.01);
U.S. Cl.
CPC ...
H05K 3/4007 (2013.01); H05K 1/0269 (2013.01); H01L 23/49822 (2013.01); H01L 21/4857 (2013.01); H01L 23/544 (2013.01); H01L 21/6835 (2013.01); H05K 1/113 (2013.01); H05K 3/4602 (2013.01); H05K 3/4682 (2013.01); H05K 2201/09781 (2013.01); H05K 2203/072 (2013.01); H05K 2203/1105 (2013.01); H01L 2224/16225 (2013.01); H01L 2924/19105 (2013.01); H01L 2221/68331 (2013.01); H01L 2221/68345 (2013.01); H01L 2221/68381 (2013.01); H01L 2223/54406 (2013.01); H01L 2223/5442 (2013.01); H01L 2223/54426 (2013.01); H01L 2223/54433 (2013.01); H01L 2223/54486 (2013.01);
Abstract

Disclosed is a method of manufacturing a multilayer wiring substrate having a principal plane of the substrate and a rear plane thereof, having a structure such that a plurality of resin insulating layers and a plurality of conductor layers are laminated, and a plurality of chip component connecting terminals to which chip components are connectable are disposed on the principal plane of the substrate. This method has a feature including a plating layer forming process in which product plating layers which provide the plurality of chip component connecting terminals and a dummy plating layer on the surrounding of the product plating layers are formed on the surface of an exposed outermost resin insulating layer at the principal plane of the substrate. This method permits a thickness dispersion of the chip component connecting terminals to be suppressed and permits a connection reliability thereof to the chip components to be increased.


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