The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2015
Filed:
Dec. 24, 2007
Applicants:
Zhenhong Sun, Shanghai, CN;
Wendy Wang, Shanghai, CN;
Hang Liao, Shanghai, CN;
Inventors:
Assignee:
Honeywell International Inc., Morristown, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12P 19/34 (2006.01); C12Q 1/68 (2006.01); B01L 7/00 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6837 (2013.01); C12Q 1/686 (2013.01); B01L 7/52 (2013.01);
Abstract
A programmable probe design of DNA micro array and detection methodology is provided. DNA probes, which are complemented with the target DNA, are designed and classified into groups according to optimum hybridization temperature. The probes are arrayed by the group and immobilized on the substrate surface of the DNA micro array. The control system, imaging system and temperature control system are programmed to cooperate with each other during the detection process. This design increases the detection capabilities of the parallel-analysis system.