The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

May. 29, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Futoshi Hirose, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/1025 (2013.01); A61B 3/0091 (2013.01); A61B 3/14 (2013.01);
Abstract

An imaging apparatus includes a measuring light focusing unit configured to focus measuring light for measuring aberration of an object on the object, an aberration correction unit configured to change a state based on the aberration measured with the measuring light, an imaging light focusing unit configured to focus imaging light for capturing an image of the object on the object, an imaging unit configured to capture an image of the object with the imaging light having passed through the aberration correction unit and the imaging light focusing unit, and a control unit configured to interlockingly control states of the measuring light focusing unit and the imaging light focusing unit.


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