The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

Dec. 31, 2012
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Scott Leo Sbihli, Lexington, MA (US);

Jason Howard Messinger, Andover, MA (US);

Francois Xavier De Fromont, State College, PA (US);

Robert Carroll Ward, Essex, CT (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 3/00 (2006.01); G01N 29/265 (2006.01); G01P 1/00 (2006.01); G01N 27/90 (2006.01); G01N 29/22 (2006.01); G01N 29/27 (2006.01); G01N 29/275 (2006.01); G01N 29/32 (2006.01); G01N 21/954 (2006.01);
U.S. Cl.
CPC ...
G01P 1/00 (2013.01); G01N 27/902 (2013.01); G01N 27/9026 (2013.01); G01N 27/906 (2013.01); G01N 29/225 (2013.01); G01N 29/265 (2013.01); G01N 29/27 (2013.01); G01N 29/275 (2013.01); G01N 29/32 (2013.01); G01N 21/954 (2013.01);
Abstract

A system includes a non-destructive testing (NDT) system having an NDT probe and a processor. The NDT probe includes a testing sensor and a motion sensor. The testing sensor is configured to capture sensor data from an inspection area, and the motion sensor is configured to detect a measurement speed at which the NDT probe moves relative to the inspection area. The processor is configured to determine a speed comparison between the measurement speed and a reference speed range.


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