The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2015
Filed:
Mar. 08, 2012
James Romanelli, Colchester, CT (US);
James Romanelli, Colchester, CT (US);
United Technologies Corporation, Hartford, CT (US);
Abstract
A method for inspecting a surface geometry of a workpiece includes mounting the workpiece to a measurement artifact that includes a plurality of parametric datum features. The parametric datum features may be utilized by a first inspection device and a second inspection device to establish a measurement coordinate system. The surface geometry is measured relative to the measurement coordinate system with the first inspection device to provide first measurement data. The surface geometry is also measured relative to the measurement coordinate system with the second inspection device to provide second measurement data.