The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

Mar. 04, 2013
Applicant:

The Johns Hopkins University, Baltimore, MD (US);

Inventors:

Margaret F. Lospinuso, Laurel, MD (US);

David M. Patrone, Ellicott City, MD (US);

David P. Silberberg, Baltimore, MD (US);

Jonathan D. Cohen, Glenwood, MD (US);

Ryan W. Gardner, Columbia, MD (US);

Laura J. Glendenning, Columbia, MD (US);

Sakunthala Harshavardhana, Marlboro, NJ (US);

Robert T. Hider, Silver Spring, MD (US);

C. Durward McDonell, III, Olney, MD (US);

Dennis S. Patrone, Buffalo, NY (US);

Nathan S. Reller, Baltimore, MD (US);

Benjamin R. Salazar, Laurel, MD (US);

Assignee:

The Johns Hopkins University, Baltimore, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/56 (2013.01);
U.S. Cl.
CPC ...
G06F 21/562 (2013.01); G06F 21/561 (2013.01);
Abstract

An apparatus for identifying related code variants may include processing circuitry configured to execute instructions for receiving query binary code, processing the query binary code to generate one or more query code fingerprints comprising compressed representations of respective functional components of the query binary code, comparing the one or more query code fingerprints to at least some reference code fingerprints stored in a database to determine a similarity measure between the one or more query code fingerprints and at least some of the reference code fingerprints, and preparing at least one report based on the similarity measure.


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