The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

May. 09, 2013
Applicants:

Salvatore J Stolfo, Ridgewood, NJ (US);

KE Wang, Sunnyvale, CA (US);

Janak Parekh, Manhasset, NY (US);

Inventors:

Salvatore J Stolfo, Ridgewood, NJ (US);

Ke Wang, Sunnyvale, CA (US);

Janak Parekh, Manhasset, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1416 (2013.01);
Abstract

Systems, methods, and media for outputting data based on anomaly detection are provided. In some embodiments, a method for outputting data based on anomaly detection is provided, the method comprising: receiving, using a hardware processor, an input dataset; identifying grams in the input dataset that substantially include distinct byte values; creating an input subset by removing the identified grams from the input dataset; determining whether the input dataset is likely to be anomalous based on the identified grams, and determining whether the input dataset is likely to be anomalous by applying the input subset to a binary anomaly detection model to check for an n-gram in the input subset; and outputting the input dataset based on the likelihood that the input dataset is anomalous.


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