The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Feb. 16, 2014
Ssu-pin MA, San Jose, CA (US);
Ssu-Pin Ma, San Jose, CA (US);
Other;
Abstract
A system for testing electronic circuits is configured to receive a test signal and an ideal response signal and output a test result signal. The system for testing electronic circuits includes a circuit portion under test, a comparator and a comparison result recorder. The circuit portion under test receives a test signal from a test instrument, and outputs a system response signal. The comparator receives the system response signal from the circuit portion to be tested and receives an ideal response signal from the test instrument. The comparator outputs comparison results according to the system response signal and the ideal response signal. The comparison result recorder receives and records the comparison result. The system receives at least a portion of test signals and at least a portion of ideal response signals in a dynamically configurable time-interleaved manner via one or more physical channels from a test equipment.