The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Nov. 21, 2013
Hitachi, Ltd., Tokyo, JP;
Yutaka Kudo, San Jose, CA (US);
Tetsuya Masuishi, San Jose, CA (US);
Takahiro Fujita, San Jose, CA (US);
Yoshitsugu Ono, San Jose, CA (US);
Hitachi, Ltd., Tokyo, JP;
Abstract
A technique determines which configuration change(s) caused an application invocation failure of a computer application without the need for a knowledge database. To determine which configuration change is the most likely cause, the cause analysis program checks other computers that have experienced the same configuration changes. The cause analysis program checks and counts the application invocation results before and after each configuration change is done. If the same configuration changes are found in the other computers, the program checks whether each configuration change caused or cured the same problem in that computer. The program counts the similar cases for all of the computers. Subsequently, the program calculates the ratio of those instances involving a change from success to failure and the ratio of those instances involving a change from failure to success out of all instances for each configuration change.