The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
May. 16, 2012
Gregory A. Harrison, Oviedo, FL (US);
Michael A. Bodkin, Orlando, FL (US);
Sreerupa Das, Oviedo, FL (US);
Richard Hall, Orlando, FL (US);
Gregory A. Harrison, Oviedo, FL (US);
Michael A. Bodkin, Orlando, FL (US);
Sreerupa Das, Oviedo, FL (US);
Richard Hall, Orlando, FL (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
Systems and methods are disclosed for more accurately estimating a remaining useful life (RUL) of an item. The RUL of the item is estimated by determining probability values throughout a time period. Each probability value quantifies a probability that a failure event of the item will occur by a time in a time segment of the time period. Based on the probability values, the particular time segment in which the failure event is most likely to occur is determined. Once the particular time segment is determined, the presentation of a visual representation of at least a portion of the time period can be effected. The visual representation indicates that the failure event of the item is most likely to occur during the particular time segment.