The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

Feb. 02, 2010
Applicant:

Harold G. Pfutzner, Richmond, TX (US);

Inventor:

Harold G. Pfutzner, Richmond, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/40 (2006.01); G01V 7/06 (2006.01); G01V 1/24 (2006.01); G01V 1/16 (2006.01); E21B 47/09 (2012.01); E21B 23/00 (2006.01);
U.S. Cl.
CPC ...
G01V 7/06 (2013.01); G01V 1/24 (2013.01); G01V 1/16 (2013.01); E21B 47/09 (2013.01); E21B 23/00 (2013.01);
Abstract

A system and method for use in a downhole tool having distance measurement, feature detection, and primary measurement devices positioned therein are provided. In one example, the method includes recording a first plurality of features and corresponding positions in a first log using the feature detection device and the distance measurement device, respectively. A first feature of the first plurality of features is selected and the position corresponding to the first feature is identified. The feature detection device is aligned relative to the first feature based on the identified position. A first primary measurement is taken using the primary measurement device while the feature detection device is aligned relative to the first feature. The steps of recording, selecting, moving, and taking are repeated to obtain a second primary measurement while the feature detection device is aligned relative to a second feature of a second plurality of features.


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