The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Nov. 15, 2005
Applicant:
Thomas Feilkas, Grafing, DE;
Inventor:
Thomas Feilkas, Grafing, DE;
Assignee:
Brainlab AG, Feldkirchen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01); A61B 5/06 (2006.01); A61B 17/28 (2006.01); A61B 19/00 (2006.01); A61B 17/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/06 (2013.01); A61B 17/28 (2013.01); A61B 19/50 (2013.01); A61B 19/52 (2013.01); A61B 19/5212 (2013.01); A61B 19/5244 (2013.01); A61B 2017/00725 (2013.01); A61B 2019/502 (2013.01); A61B 2019/5255 (2013.01); A61B 2019/5483 (2013.01);
Abstract
A system and method for calibrating an object having at least one marker attached thereto, wherein a spatial position of the object is ascertained based on the at least one marker, and an outline, view or geometry of the object is optically detected from at least one side. The detected outline, view or geometry is compared with corresponding outlines, views or geometries of stored pre-calibration data of the object, said pre-calibration data representing a model of the object.