The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Jan. 28, 2012
Applicants:
Aviv Mazer, Stanford, CA (US);
Robert Dougherty, Menlo Park, CA (US);
Brian Wandell, Stanford, CA (US);
Inventors:
Aviv Mazer, Stanford, CA (US);
Robert Dougherty, Menlo Park, CA (US);
Brian Wandell, Stanford, CA (US);
Assignee:
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/055 (2006.01); G01R 33/50 (2006.01); A61B 5/00 (2006.01); A61B 5/107 (2006.01);
U.S. Cl.
CPC ...
A61B 5/055 (2013.01); A61B 5/0042 (2013.01); A61B 5/1073 (2013.01); G01R 33/50 (2013.01);
Abstract
The present invention provides methods to detect degenerative processes and abnormalities in soft tissues at high spatial resolution, high signal-to-noise ratio and short scanning times, based on quantitative tissue properties. These methods might provide a useful tool to detect and assess abnormalities in soft tissues and to monitor disease progression.