The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Jul. 02, 2013
Applicant:
Fujitsu Limited, Kawasaki, Kanagawa, JP;
Inventor:
Satoshi Mikami, Kawasaki, JP;
Assignee:
Fujitsu Limted, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 36/00 (2009.01); H04W 36/30 (2009.01);
U.S. Cl.
CPC ...
H04W 36/30 (2013.01); H04W 36/0083 (2013.01);
Abstract
There is provided a reception quality measurement method that measures reception quality of a measurement target cell with a mobile terminal apparatus. The method includes performing reception quality measurements in a certain bandwidth with respect to each of a plurality of frequencies in a frequency band of the measurement target cell when the frequency band of the measurement target cell and a frequency band of a neighboring cell overlap with each other, and averaging results of the reception quality measurements at the plurality of frequencies to obtain an averaged value as the reception quality of the measurement target cell.