The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

Dec. 30, 2012
Applicant:

Ziva Corporation, San Diego, CA (US);

Inventors:

Eliseo Ranalli, Irvine, CA (US);

Robert Saperstein, La Jolla, CA (US);

Assignee:

Ziva Corporation, San Diego, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06K 9/46 (2006.01); H04N 5/265 (2006.01); G06T 5/00 (2006.01); G06T 5/10 (2006.01); G06T 5/20 (2006.01); G06T 5/50 (2006.01); H04N 5/217 (2011.01); H04N 5/232 (2006.01); H04N 5/238 (2006.01);
U.S. Cl.
CPC ...
H04N 5/265 (2013.01); G06T 5/003 (2013.01); G06T 5/10 (2013.01); G06T 5/20 (2013.01); G06T 5/50 (2013.01); G06T 2207/20056 (2013.01); H04N 5/217 (2013.01); H04N 5/23232 (2013.01); H04N 5/238 (2013.01);
Abstract

In selected embodiments, improved image restoration is realized using extensions of Wiener filtering combined with multiple image captures acquired after simple, fast reconfigurations of an optical imaging system. These reconfigurations may yield distinct OTF responses for each capture. The optical imaging system may reduce fabrication cost, power consumption, and/or system weight/volume by correcting significant optical aberrations. The system may be configured to perform independent correction of fields within the total field-of-regard. The system may also be configured to perform independent correction of different spectral bands.


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