The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

Feb. 02, 2010
Applicants:

Anant Madabhushi, South Plainfield, NJ (US);

Ajay Basavanhally, Skillman, NJ (US);

Shridar Ganesan, Westfield, NJ (US);

Inventors:

Anant Madabhushi, South Plainfield, NJ (US);

Ajay Basavanhally, Skillman, NJ (US);

Shridar Ganesan, Westfield, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06K 9/00147 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30096 (2013.01);
Abstract

The present invention relates to an image-based computer-aided prognosis (CAP) system and method that seeks to replicate the prognostic power of molecular assays in histopathology and pathological processes, including but not limited to cancer. Using only a tissue slide samples, a mechanism for digital slide scanning, and a computer, the present invention relates to an image-based CAP system and method which aims to overcome many of the drawbacks associated with prognostic molecular assays (e.g. Oncotype DX) including the high cost associated with the assay, limited laboratory facilities with specialized equipment, and length of time between biopsy and prognostic prediction.


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