The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Feb. 14, 2012
Catherine P. Tarnowski, Mahtomedi, MN (US);
Kenneth G. Brittain, Cottage Grove, MN (US);
David L. Hofeldt, Oakdale, MN (US);
Andrzej P. Jaworski, Woodbury, MN (US);
Gregory D. Kostuch, Mahtomedi, MN (US);
John A. Ramthun, Hudson, WI (US);
Evan J. Ribnick, St. Louis Park, MN (US);
Esa H. Vilkama, Plymouth, MN (US);
Derek H. Justice, Cary, NC (US);
Guillermo Sapiro, Durham, NC (US);
Catherine P. Tarnowski, Mahtomedi, MN (US);
Kenneth G. Brittain, Cottage Grove, MN (US);
David L. Hofeldt, Oakdale, MN (US);
Andrzej P. Jaworski, Woodbury, MN (US);
Gregory D. Kostuch, Mahtomedi, MN (US);
John A. Ramthun, Hudson, WI (US);
Evan J. Ribnick, St. Louis Park, MN (US);
Esa H. Vilkama, Plymouth, MN (US);
Derek H. Justice, Cary, NC (US);
Guillermo Sapiro, Durham, NC (US);
3M Innovative Properties Company, St. Paul, MN (US);
Abstract
A system is described for detecting the presence of non-uniformity patterns and providing output indicative of a severity of each type of non-uniformity pattern. The system includes a computerized rating tool that assists a user in efficiently and consistently assigning expert ratings (i.e., labels) to a large collection of training images representing samples of a given product. In addition, the rating software develops a model that allows a computerized inspection system to detect the presence of non-uniformity patterns in a manufactured web material in real time and provide output indicative of a severity level of each pattern on a continuous scale. The system also includes algorithmic and hardware approaches to significantly that increase the throughput of the inspection system.