The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

Feb. 18, 2013
Applicant:

Hitachi High-tech Science Corporation, Minato-ku, Tokyo, JP;

Inventor:

Yoshiki Matoba, Chiba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/083 (2006.01); H05G 1/02 (2006.01); G21K 5/10 (2006.01); G01N 21/86 (2006.01); H01J 37/20 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01);
Abstract

A transmission X-ray analyzer () for detecting a transmission X-ray image of a sample () that is continuous in a band shape includes: a TDI sensor (); an X-ray source () arranged opposed to a TDI sensor; a pair of support rollers () arranged away from the TDI sensor between the TDI sensor and the X-ray source, the pair of support rollers being configured to transport the sample to a detection position of the TDI sensor while keeping a constant interval between the TDI sensor and the sample; and a pair of outside rollers () arranged respectively on an outer side of the pair of support rollers in a transportation direction (L). One of the pair of support rollers and one of the pair of outside rollers are arranged at different positions as to apply a tension to the sample between the pair of support rollers.


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