The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Jun. 21, 2012
Applicants:
Stefan Lautenschläger, Hausen, DE;
Michael Pflaum, Röttenbach, DE;
Inventors:
Stefan Lautenschläger, Hausen, DE;
Michael Pflaum, Röttenbach, DE;
Assignee:
Siemens Aktiengesellschaft, München, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/083 (2006.01); H05G 1/56 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/5217 (2013.01); A61B 6/542 (2013.01); A61B 6/4441 (2013.01); A61B 6/5235 (2013.01); A61B 6/547 (2013.01);
Abstract
A method for representing an exposure to radiation of an examination area of an object caused by radiological imaging is proposed. A 3D image of the examination area of the object being examined is acquired. Absorption coefficients of the examination area are determined. The radiation exposure of the examination area caused by radiological imaging is determined and is represented in the 3D image. A termination criterion is queried. The radiation exposure of the examination area is iteratively determined till the termination criterion is fulfilled.